| MRC | Criteria | Characteristic |
|---|
| DIGITAL | ABKW | OVERALL HEIGHT0 425 INCHES MAXIMUM |
| DIGITAL | ADAQ | BODY LENGTH1 290 INCHES MAXIMUM |
| DIGITAL | ADAT | BODY WIDTH0 500 INCHES MINIMUM AND 0 610 INCHES MAXIMUM |
| DIGITAL | ADAU | BODY HEIGHT0 150 INCHES MINIMUM AND 0 210 INCHES MAXIMUM |
| DIGITAL | AEHX | MAXIMUM POWER DISSIPATION RATING1 0 WATTS |
| DIGITAL | AFGA | OPERATING TEMP RANGE-55 0125 0 DEG CELSIUS |
| DIGITAL | AFJQ | STORAGE TEMP RANGE-65 0150 0 DEG CELSIUS |
| DIGITAL | CBBL | FEATURES PROVIDEDPROGRAMMABLE AND HERMETICALLY SEALED AND BURN IN AND MONOLITHIC AND WCLOCK |
| DIGITAL | CQSJ | INCLOSURE MATERIALCERAMIC |
| DIGITAL | CQSZ | INCLOSURE CONFIGURATIONDUAL-IN-LINE |
| DIGITAL | CQWX | OUTPUT LOGIC FORMN-TYPE METAL OXIDE-SEMICONDUCTOR LOGIC |
| DIGITAL | CQZP | INPUT CIRCUIT PATTERN19 INPUT |
| DIGITAL | CSSL | DESIGN FUNCTION AND QUANTITY1 TIMER INTERVAL |
| DIGITAL | CTFT | CASE OUTLINE SOURCE AND DESIGNATORD-3 MIL-M-38510 |
| DIGITAL | CWSG | TERMINAL SURFACE TREATMENTSOLDER |
| DIGITAL | CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC-0 5 VOLTS MINIMUM POWER SOURCE AND 7 0 VOLTS MAXIMUM POWER SOURCE |
| DIGITAL | CZEQ | TIME RATING PER CHACTERISTIC220 00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME LOW TO HIGH LEVEL OUTPUT AND 220 00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME HIGH TO LOW LEVEL OUTPUT |
| DIGITAL | TEST | TEST DATA DOCUMENT96906-MIL-STD-883 STANDARD INCLUDES INDUSTRY OR ASSOCIATION STANDARDS INDIVIDUAL MANUFACTUREER STANDARDS ETC |
| DIGITAL | TTQY | TERMINAL TYPE AND QUANTITY24 PRINTED CIRCUIT |
