Thank you for taking interest in Voron Electronics Corp part number TS268EU, which is listed with the NSN 6625-00-923-6534 and a product description of “Test Set Semiconduc.” In order to receive procurement options on this particular listing, we ask that you fill out and submit the form provided below with as much information as you can concerning your needs. By supplying our staff with key details on your desired quantity, pricing target, and expedited fulfillment timeframe, we can respond with a quote that has been specifically tailored to your unique specifications. We also ask that you make us aware of any restrictions that you may have as soon as possible, such as if you have a time constraint or are seeking unlisted items.
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| MRC | Criteria | Characteristic |
|---|---|---|
| ABRY | Length | 8.187 INCHES NOMINAL |
| MRC | Decoded Requirement | Clear Text Reply |
| HGTH | Height | 3.625 INCHES NOMINAL |
| AQXZ | Operating Test Capability | FRONT RESISTANCE-NOT GREATER THAN 0.5 KILOHM FOR A GOOD CRYSTAL; BACK RESISTANCE-RATIO OF BACK TO FRONT RESISTANCE GREATER THAN 10 TO 1 FOR A GOOD CRYSTAL; BACK CURRENT-CRYSTAL SHOULD NOT INDICATE CURRENT GREATER THAN - CRYSTAL IN21 AND IN23,IN23A,IN25,IN21A AND IN23B,IN21B,IN26 WE,IN26 SYL,IN78 SYL - CURRENT D. C. 0.400 MA,0.300 MA,0.250 MA,0.175 MA,0.125 MA,0.110 MA,0.230 MA,0.160 MA |
| ABGL | Width | 6.000 INCHES NOMINAL |
| AQXY | Test Type For Which Designed | FRONT RESISTANCE OF CRYSTAL; BACK RESISTANCE OF CRYSTAL; BACK CURRENT OF CRYSTAL |
| ALSF | Internal Battery Accommodation | INCLUDED |
| ANPZ | Inclosure Feature | SINGLE ITEM W/CARRYING CASE |
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